JESD8 9B PDF

EIA Standard. JEDEC is the leading developer of standards for the solid-state industry, they have published over documents to date. Almost representatives, appointed by some JEDEC member companies work together in 50 JEDEC committees to meet the needs of every segment of the industry, manufacturers and consumers alike. The Standards, Publications, and Outlines that they generate are accepted throughout the world. Arlington, Virginia ? JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally.

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EIA Standard. JEDEC is the leading developer of standards for the solid-state industry, they have published over documents to date. Almost representatives, appointed by some JEDEC member companies work together in 50 JEDEC committees to meet the needs of every segment of the industry, manufacturers and consumers alike.

The Standards, Publications, and Outlines that they generate are accepted throughout the world. Arlington, Virginia ? JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally.

JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint.

No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Published by? By downloading this file the individual agrees not to charge for or resell the resulting material.

O rgan iz atio ns m ay ob tain perm issio n to rep rod uce a lim ited n um b er o f co pies thro ugh enterin g in to a licen se agreem en t.

F or info rm ation , con tact:? The second clause defines the minimum dc and ac input parametric requirements and ac test conditions for inputs on compliant devices. The third clause specifies the minimum required output characteristics of, and ac test conditions for, compliant outputs targeted for various application environments.

The output specifications are divided into two classes, Class I and Class II, which are distinguished by drive requirements and application. The standard is particularly intended to improve operation in situations where busses must be isolated from relatively large stubs.

External resistors provide this isolation and also reduce the on-chip power dissipation of the drivers. Busses may be terminated by resistors to an external termination voltage. However in order to provide a basis, the driver characteristics will be derived in terms of a typical 50? While driver characteristics are derived from a 50?

The system designer will be able to vary impedance levels, termination resistors and supply voltage and be able to calculate the effect on system voltage margins. This is accomplished precisely because drivers and receivers are specified independently of each other.

The standard defines a reference voltage VREF which is used at the receivers as well as a voltage VTT to which termination resistors are connected. In some standards this ratio equals 0. Making this distinction is important for the design of high gain, differential, receivers that are required.

The ac values are chosen to indicate the levels at which the receiver must meet its timing specifications. The dc values are chosen such that the final logic state is unambiguously defined, that is once the receiver input has crossed this value, the receiver will change to and maintain the new logic state.

The system designer can be sure that the device will switch state a certain amount of time after the input has crossed ac threshold and not switch back as long as the input stays beyond the dc threshold.

The relationship of the different levels is shown in figure 1. An example of ringing is illustrated in the dotted wave-form. VDDQ 2. Typically the value of VREF is expected to be 0.

However, in the case of VIH Max. Units V V Notes 2. The tester may therefore supply signals with a 1. Note however, that all timing specifications are still set relative to the ac input level. This is illustrated in figure 2. See also figure 2. NOTE 4 AC test conditions may be measured under nominal voltage conditions as long as the supplier can demonstrate by analysis that the device will meet its timing specifications under all supported voltage conditions.

The specifications are quite different from traditional specifications, where minimum values for VOH and maximum values for VOL are set that apply to the entire supply range. Figure 3 shows the typical dc environment that the output buffer is presented with. VTT Receiver 50? VTT is specified as being equal to 0. In order to meet the mV minimum requirement for VIN, a minimum of 8. Class I or Class II.

The driver specification now must guarantee that these values of VIN are obtained in the worst case conditions specified by this standard. Class I 2. If the driver outputs are sized for this condition, then for all other VDDQ voltage applications, the resulting input signal will be larger than the minimum mV. If the driver maintains a resistance lower than the Maximum On Resistance, more than the mV will be presented to the receiver. Under these conditions VOH is 1.

V SS 50? This clause is added to set the conditions under which the driver ac specifications can be tested. The test circuit is assumed to be similar to the circuit shown in figure 4. AC test conditions may be measured under nominal voltage conditions as long as the supplier can demonstrate by analysis, that the device will meet its timing specifications under all supported voltage conditions. With a series resistor of 25? The test circuit is assumed to be similar to the circuit shown in figure 5.

In this non binding section we will show some derived applications. Clearly it is not the intention to show all possible variations in this standard. An example of this is shown in figure 6. An example of this may be address drivers on a memory board. An example is shown in figure 7. One advantage of this approach is that there is no need for a VTT power supply.

An example is shown in figure 8. In this example a Class II type buffer might be preferred since it comes closer, in conjunction with the series resistor, to match the characteristic impedance of the transmission line. However, the drivers are connected directly onto the bus so there are no stubs present.

In that case, the designer may decide to eliminate the series resistors entirely. However a Class II buffer would dissipate more power due to its larger current drive and thus might require special cooling.

DUT 50? Vx ac indicates the voltage at which differential input signals must be crossing. Note however, that all timing specifications are still set relative to the differential ac input level.

NOTE 2 A 1. Compliant devices must meet the VSwing ac specification under actual use conditions. See table 8b. See figure This can be expressed by equation-1 or equation Receiver VDD 0. Viso Parameter Input clock signal offset voltage Viso variation Min. Units V mV Notes 1 1 0. See figure 13b.

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